SAP Device Management Tables

Are you looking for the right table related to SAP Device Management Tables to query in an ABAP Program, Class, Function Module and OData API?

There are number of standard tables in SAP S/4HANA system. The data of an application is distributed across several database fields. Finding the right table is important, in this post we'll look at list of all the tables in Device Management (IS-U-DM) module.

Top 10 tables in Device Management

TableDescription
TE359TCertificat. Types (Texts)
EFKLASTIS-U Device Checker: Definition of Error Classes (Texts)
TE1002TCombination of Rating, Primary, and Secondary Voltage (Text)
TE025ASample Device Determination
EGTUR_HEADCreation Data for Periodic Repl. List EGTUR
EFKLASIS-U Device Checker: Definition of Error Class
EGERHHistorical Data of ISU Device Master Record
TE025DSample Algorithm Determination
EGERRDevice data: Info record for point of delivery - historical
TE237TConstruction class (text)

List of tables in Device Management

TableDescription
TE359TCertificat. Types (Texts)
EFKLASTIS-U Device Checker: Definition of Error Classes (Texts)
TE1002TCombination of Rating, Primary, and Secondary Voltage (Text)
TE025ASample Device Determination
EGTUR_HEADCreation Data for Periodic Repl. List EGTUR
EFKLASIS-U Device Checker: Definition of Error Class
EGERHHistorical Data of ISU Device Master Record
TE025DSample Algorithm Determination
EGERRDevice data: Info record for point of delivery - historical
TE237TConstruction class (text)
TE237Constr.Cls
EEAGInput/Output Group
EDTIDIS-U Device Checker: Allocation of Table Names - Table IDs
EGERSIS-U Device Master Data
TE025BExtension Periods for Official Lots
EDEVGR_CDChange Document for Dev. Group: Table with Device Data
TE527TSearch Term: I/O Group (Text)
TE285TAccuracy Class (Text)
TE593Types of Device Group
TE271ESample Lot - Canadian Sampling Inspection
TE057TBasic Dev. Cats (Text)
TE525Search Term for Register Grp
TE059TRegister Display Types (texts)
TE063Manufacturer
TE055TFunction Classes (text)
TELOT_LOCKEDBlocked Devices During Lot Compilation (B/NL)
EFQUELIS-U Device Checker: Definition of Cause of Error
TE927Parametr. for Device
TE055Function Classes
TE387Input/Output Values
TE383Input/Output Cat.
TE068Permissibility of Register Codes for Each Division Category
TEKENNZIFFTRegister Code Texts
TE059Register Display Types
TE385Function Type
TE381Winding Types
TE381TWinding Types (text)
TE587TSearch Terms for Com. Groups (Txt)
TE387TInput/Output Values (Text)
TE285Accuracy Class
TEKENNZIFFRegister Codes
TEPPMTPrepayment Meter Texts
EZWG_HEADRegister Group: Header Data
TELOT_RESULTResults of Lot Allocation for Belgium/Netherlands
TE683Periodic Repl. Variants
TE9XX1Help Table for Specifying Material/Equipment Ref.
EFLOGIS-U Device Checker: Log File for all Analyzed Errors
TE571Sample Devs per Sample Lot
TE1001TPower Transformer: Loss Determination Group (Text)
TE359Certificat. Types
TE593TTypes of Device Group (Text)
TEAPPRVLNRAlloc. of Manufacturer/Cat. Desc. to Inspection No. (B/NL)
TE927TParametrzn for Device (Txt)
TE690Control Parameters for Creation of Orders and Notifications
TE937Seal Code for Sample Lot
TE383TInput/output category (text)
TE275TSearch Term for Winding Group (Txt)
TE025CSample Device Determination
TE373TCommand/Programming (texts)
TE379TWinding Demand (Text)
TE065TRegister IDs (text)
TE271Sample Lot
TE270WGSystem Parameters for Winding Group
TE065Register Identif.
TE263Permiss. Combinations of Basic Dev. Cats per Division Cat.
TEMANUFCATCombination: Manufact./Manufact.Cat.Descr. and DevCat.(B/NL)
EDEVGRMaster Data for Device Group
EDEVCHECK_BACKUPIS-U Device Checker: Test Data Backup
TE523TRegister Types (Text)
TE270System Parameters for Sampling Proc./Cert. in IS-U DevMan.
TE270EZWG_DIMUnits of Measurement for Register Categories of Reg. Group
TEDEVCLTYPEControl Parameters for Linking Classif. System to Dev.
EZWGRegister Group
TEPRRELTInspection Relevance of Devices: Indicator (Text)
TEPRRELInspection Relevance of Devices: Indicator
TE937TSeal Codes for Sample Lot (Text)
EANA_FUBAIS-U Device Checker: Alloc. of Init. Table - Analysis FuMo
TE276TNominal Voltage (Text)
TELOT_RESULT_TOPHeader Table for Lot Allocation Results for B/NL
TE1001Power Transformer: Loss Determination Group
TE684Control Parameter: Periodic Repl.
TE057Basic DeviceCat.
EGTURPeriodic Replacement List
TE131Movement Types for Lot Creation for Certification
TE595Allocation of Group Type to Division
EANATIS-U Device Checker: Descriptive Texts for Indiv. Analyses
EWIKWinding Group
ETYPDevice Category: IS-U Additional Data for the Material
TE1002Combination of Rating, Primary, and Secondary Voltage
EANASIS-U Device Checker: Current Processing Status of Test
TE371Switching Times of a Command
TE554Random Number Table According to DIN 5741
EGEREDraw and Sampling Number of a Device
TE523Register Types
TE270EGERRSystem Parameters for Dev. Info Records (IS-U Device Mgmnt)
EGLODevices per Sample Lot
TE385TFunction Type (Txt)
TE269Dev.Req. Planning
TE373Command/Programming
TEPPMPrepayment Meter
TE389Input/Output Connections
TELOT_CRDEFSpecifications for Lot Compilation (B/NL)
TEKEMAKZSeal Indicator (B/NL)
TE275Search Term for Winding Grp
EREP_FUBAIS-U Device Checker: Allocation Initial Table - Repair FuMo
TE525TRegister Group Search Term (Text)
ETKOMBIS-U Device Checker: Definition of Test Combination
EKOGCommand Group
TE276Nominal Voltage
TE389TInput/Output Connections (Text)
TE587Search Term for Command Grp
TE379Winding Demand
TE527Search Term for I/O Grp